Materials Characterization Using Nondestructive Evaluation...

Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Altpeter, Iris, Herrmann, Hans-Georg, Hübschen, Gerhard, Tschuncky, Ralf
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Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures.

Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries.

Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress.

  • Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques
  • Reviews the determination of microstructural and mechanical properties
  • Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries
  • Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials

Категории:
Година:
2016
Издание:
1
Издателство:
Woodhead Publishing
Език:
english
Страници:
320
ISBN 10:
1845699890
ISBN 13:
9781855735873
Серия:
Woodhead Publishing series in electronic and optical materials 88
Файл:
PDF, 31.26 MB
IPFS:
CID , CID Blake2b
english, 2016
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